X-ray photoelectron spectroscopy
A SURFACE-SENSITIVE QUANTITATIVE SPECTROSCOPIC TECHNIQUE THAT MEASURES THE ELEMENTAL COMPOSITION AT THE PARTS PER THOUSAND RANGE, EMPIRICAL FORMULA, CHEMICAL STATE AND ELECTRONIC STATE OF THE ELEMENTS THAT EXIST WITHIN A MATERIAL.
ESCA; X-ray photoemission spectroscopy; X-ray photoelectron emission microscopy; X-ray photoelectron; X-ray-photoelectron-spectroscopy; X-ray photoelectron spectrum; Electron spectroscopy for chemical analysis
X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique based on the photoelectric effect that can identify the elements that exist within a material (elemental composition) or are covering its surface, as well as their chemical state, and the overall electronic structure and density of the electronic states in the material. XPS is a powerful measurement technique because it not only shows what elements are present, but also what other elements they are bonded to.